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Sculptured Thin Films
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TEM of SFN 224

SEM picture of a nano-4-fold strcuture grown with glancing angle deposition (GLAD)

 
MM224

Color plots of Mueller matrix (forth row excluded) from the chiral structure in the left SEM picture versus in-plane angle j and angle of incidence F. (-1 ≤ x = sinF cosj ≤ 1; -1 ≤ y = sinF sinj ≤ 1; 400 nm ≤ l ≤ 975 nm, step = 25 nm)

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