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Prof. Dr. John A. Woollam
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Publications
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M. Schubert, T.E. Tiwald and J.A. Woollam, Explicit Solutions for the Optical Properties of Arbitrary Magneto-Optic Materials in Generalized Ellipsometry, Applied Optics 38 (1), 177 (1999).
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J.S. Hale and J.A. Woollam, Prospects for Infrared Emissivity Control Using Electrochromic Structures, Thin Solid Films 339, 174 (1999).
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M.J. DeVries, C. Trimble. T.E. Tiwald, D.W. Thompson, J.A. Woollam and J.S. Hale, Optical Constants of Crystalline WO3 Deposited by Magnetron Sputtering, JVSTA, 17(5), 2906 (1999).
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M. Schubert, J.A. Woollam, A. Kasic, B. Rheinlander, J. Off, B. Huhn, F. Scholz, Free-carrier Response and Lattice Modes of Group III-Nitride Heterostructures Measured by Infrared Ellipsometry, Physica Status Solidi (b), 216, 655 (1999).
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T. Tiwald, J.A. Woollam, S. Zollner, J. Christiansen, R.B. Gregory, T. Wetteroth, S.R. Wilson, and A.R. Powell, Carrier Concentration and Lattice Absorption in Bulk and Epitaxial Silicon Carbide Determined using Infrared Ellipsometry, Phys. Rev. B 60 (16). 464 (1999).
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C. Trimble, M. DeVries, J.S. Hale, D.W. Thompson, T.E. Tiwald and J.A. Woollam, Infrared Emittance Modulation Devices Using Electrochromic Crystalline Tungsten Oxide, Polymer Conductor, and Nickel Oxide, Thin Solid Films 355-356, 26 (1999).
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M. Schubert, T. Hofmann, Bernd Rheinl�nder, I. Pietzonka, T. Sass, Volker Gottschalch and J.A. Woollam, Near-Band-Gap CuPt Order - Birefringence in Al0.48Ga0.52InP, Phys. Rev. B 60 24, 16618 (1999). Invited.
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C. L. Bungay, T.E. Tiwald, M.J. DeVries, B.J. Dworak and J.A. Woollam, Characterization of UV Irradiated Space Application Polymers by Spectroscopic Ellipsometry, Polymer Engineering & Science 40 (2), 300 (2000).
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E. Franke, M. Schubert, J.A. Woollam, J.-D. Hecht, G. Wagner, H. Neumann and F. Gigl, In-situ Ellipsometry Growth Characterization of Dual Ion Beam Deposited Boron Nitride Thin Films, JAP 87 (5), 2593, (2000).
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J.A. Woollam, Ellipsometry, Variable Angle Spectroscopic, Wiley Encyclopedia of Electrical and Electronics Engineering, Supplement I, J.G. Webster, Editor; Wiley & Sons, 109-117, 2000.
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M. Schubert, A. Kasic, T.E Tiwald, J.A. Woollam, J. Off, B. Kuhn, F. Scholz, Phonons and Free-carriers in a Strained Hexagonal GaN-AIN Superlattice Measured by Infrared Ellipsometry and Raman Spectroscopy Internet J. of Nitride Semicond. Res 5, W11, 39 (2000).
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