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Publications
Journal articles:
In submission
2010
2009
2008
2007
Electronic documents are intended for internal use only.
Corrections are added for misprints where known.
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2010:> |
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7. |
| Spectroscopic ellipsometry characterization of SiNx antireflection films on textured
multicrystalline and monocrystalline silicon solar cells M. F. Saenger, J. Sun, M. Sch�del, J. Hilfiker, M. Schubert, and J. A. Woollam Thin Solid Films 518, 1830 (2010) [View PDF (582 kB)] [DOI-link] |
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2009:> |
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6. |
| Infrared ellipsometric characterization of silicon nitride films on textured Si photovoltaic cells M. F. Saenger, M. Sch�del, T. Hofmann, J. Hilfiker, J. Sun, T. Tiwald, M. Schubert, and J. A. Woollam Mat. Res. Soc. Symp. Proc. 1123, P02-02 (2009) [View PDF (245 kB)] [DOI-link] |
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5. |
| Characterizing antireflection coatings on textured mono-crystalline Si with spectroscopic ellipsometry J. Sun, M. F. Saenger, M. Schubert, J. N. Hilfiker, R. Synowicki, C. M. Herzinger, and J. A. Woollam IEEE Photovoltaic Specialists Conference ISBN 978-1-4244-2949-3, 001407-001411 (2009) [View PDF (1.5 MB)] [DOI-link] |
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2008:> |
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4. |
| Lattice parameters of bulk GaN fabricated by halide vapor phase epitaxy V. Darakchieva, B. Monemar, A. Usui, M. F. Saenger, and M. Schubert J. Cryst. Growth 310, 959-965 (2008) [DOI-link] |
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3. |
| Polaron transitions in charge intercalated amorphous tungsten oxide thin films M. F. Saenger, T. H�ing, T. Hofmann, and M. Schubert phys. stat. sol. (a) 205, 914 (2008) [View PDF (580 kB)] [DOI-link] |
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2. |
| Dielectric and magnetic birefringence in low-chlorine-doped n-type Zn1-xMnxSe M. F. Saenger, M. Hetterich, R. D. Kirby, D. J. Sellmyer, and M. Schubert phys. stat. sol. (c) 5, 1007 (2008) [View PDF (493 kB)] [DOI-link] |
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1. |
| Polaron and Phonon properties in proton intercalated amorphous tungsten oxide thin films M. F. Saenger, T. H�ing, B. W. Robertson, R. B. Billa, T. Hofmann, E. Schubert, and M. Schubert Phys. Rev. B 75, 245205 (2008) [View PDF (987 kB)] [DOI-link] |
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last database entry from 2024-09-30 |
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